In the field of optoelectronics, indium tin oxide (ITO) electrodes play a crucial role in various applications, such as displays, sensors, and solar cells. Effective fault detection and diagnosis of the ITO electrodes are essential to ensure the performance and reliability of the devices. However, traditional visual inspection is challenging with transparent ITO electrodes, and existing fault detection methods have limitations in determining the root causes of the defects, often requiring destructive evaluations. In this study, an in situ fault diagnosis method is proposed using scattering parameter (S-parameter) signal processing, offering early detection, high diagnostic accuracy, noise robustness, and root cause analysis. A comprehensive S-parameter pattern database is obtained according to defect states. Deep learning (DL) approaches, including multilayer perceptron (MLP), convolutional neural network (CNN), and transformer, are then used to simultaneously analyze the cause and severity of defects. Notably, it is demonstrated that the diagnostic performance under additive noise levels can be significantly enhanced by combining different channels of the S-parameters as input to the learning algorithms, as confirmed through the t-distributed stochastic neighbor embedding (t-SNE) dimension reduction visualization.

The history of user behaviors constitutes one of the most significant characteristics in predicting the click-through rate (CTR), owing to their strong semantic and temporal correlation with the target item. While the literature has individually examined each of these correlations, research has yet to analyze them in combination, that is, the quadruple correlation of (behavior semantics, target semantics, behavior temporal, and target temporal). The effect of this correlation on performance and the extent to which existing methods learn it remain unknown. To address this gap, we empirically measure the quadruple correlation and observe intuitive yet robust quadruple patterns. We measure the learned correlation of several representative user behavior methods, but to our surprise, none of them learn such a pattern, especially the temporal one. In this paper, we propose the Temporal Interest Network (TIN) to capture the quadruple semantic and temporal correlation between behaviors and the target. We achieve this by incorporating target-aware temporal encoding, in addition to semantic embedding, to represent behaviors and the target. Furthermore, we deploy target-aware attention, along with target-aware representation, to explicitly conduct the 4-way interaction. We performed comprehensive evaluations on the Amazon and Alibaba datasets. Our proposed TIN outperforms the best-performing baselines by 0.43\% and 0.29\% on two datasets, respectively. Comprehensive analysis and visualization show that TIN is indeed capable of learning the quadruple correlation effectively, while all existing methods fail to do so. We provide our implementation of TIN in Tensorflow.

Named entity recognition (NER) systems have seen rapid progress in recent years due to the development of deep neural networks. These systems are widely used in various natural language processing applications, such as information extraction, question answering, and sentiment analysis. However, the complexity and intractability of deep neural networks can make NER systems unreliable in certain circumstances, resulting in incorrect predictions. For example, NER systems may misidentify female names as chemicals or fail to recognize the names of minority groups, leading to user dissatisfaction. To tackle this problem, we introduce TIN, a novel, widely applicable approach for automatically testing and repairing various NER systems. The key idea for automated testing is that the NER predictions of the same named entities under similar contexts should be identical. The core idea for automated repairing is that similar named entities should have the same NER prediction under the same context. We use TIN to test two SOTA NER models and two commercial NER APIs, i.e., Azure NER and AWS NER. We manually verify 784 of the suspicious issues reported by TIN and find that 702 are erroneous issues, leading to high precision (85.0%-93.4%) across four categories of NER errors: omission, over-labeling, incorrect category, and range error. For automated repairing, TIN achieves a high error reduction rate (26.8%-50.6%) over the four systems under test, which successfully repairs 1,056 out of the 1,877 reported NER errors.